Design for Testability (DFT) Solutions

Nokshsemi provides top-tier DFT Solutions for IC designs. Specializing in core and block level DFT, we optimize pre- and post-silicon processes with industry-standard techniques like JTAG, scan insertion, and advanced test optimization techniques using industry-standard EDA tools like Synopsys DFTMAX, Mentor Tessent, and Cadence Modus.

Design for Testability (DFT) Solutions

Our DFT Capabilities Include:

  • JTAG Integration: Implementing IEEE 1149.1, 1149.6, and 1687 standards for robust boundary scan.
  • Scan Insertion and ATPG: Providing extensive test coverage through scan chain insertion and Automatic Test Pattern Generation (ATPG).
  • Compression Logic and Low Power Testing: Creating compression logic IPs, implementing low power ATPG, and at-speed testing strategies.
  • Mixed-Signal DFT Strategies: Employing DFT strategies across clock and voltage domains for comprehensive mixed-signal testability.
  • Post-Silicon Diagnosis and Yield Analysis: Utilizing scan and layout-aware diagnosis for post-silicon fault detection, combined with thorough yield analysis.

Advanced DFT Techniques:

  • Test Point Insertion & X Bounding: Enhancing fault detection with strategic test points and X bounding.
  • Boundary Scan, MBIST, LBIST: Integrating boundary scan, Memory Built-In Self-Test (MBIST), and Logic Built-In Self-Test (LBIST).
  • Gate Level Simulation (GLS): Conducting GLS post-synthesis for accurate validation of testability.
  • Pattern Simulation & Debugging: Ensuring test accuracy through meticulous pattern simulation and debugging.
  • Test Data Compression: Reducing test time and data volume through effective compression techniques.

At NokshaSemi, our DFT solutions are designed to enhance the testability, reliability, and yield of your semiconductor designs, ensuring robust performance and efficient production. Partner with us to leverage our expertise and industry-leading tools for your next project.